UNIVERSITY OF CALIFORNIA, BERKELEY College of Engineering Department of Electrical Engineering and Computer Sciences Elad Alon H
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Statistical security analysis of AES with X‐tolerant response compactor against all types of test infrastructure attacks with/without novel unified countermeasure - Popat - 2019 - IET Circuits, Devices & Systems - Wiley Online Library
![Example to show that certain faults can be detected during scan chain... | Download Scientific Diagram Example to show that certain faults can be detected during scan chain... | Download Scientific Diagram](https://www.researchgate.net/publication/3224325/figure/fig10/AS:671512302456849@1537112417715/Example-to-show-that-certain-faults-can-be-detected-during-scan-chain-correctness-testing.png)